DETERMINATION OF DENSITY-OF-STATES OF NANOCLUSTER CARBON THIN FILMS MIS STRUCTURE USING CAPACITANCE–VOLTAGE TECHNIQUE
DE, SHOUNAK, GOPE, JHUMA, SATYANARAYANA, B. S., PANWAR, O. S., RAO, MOHANVolume:
25
Language:
english
Journal:
Modern Physics Letters B
DOI:
10.1142/S0217984911026152
Date:
April, 2011
File:
PDF, 233 KB
english, 2011