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Addendum. Laplacian image contrast in mirror electron microscopy
S. M. Kennedy, C. X. Zheng, W. X. Tang, D. M. Paganin and D. E. JessonVolume:
467
Language:
english
Journal:
Proceedings: Mathematical, Physical and Engineering Sciences
DOI:
10.2307/23065664
Date:
November, 2011
File:
PDF, 1017 KB
english, 2011