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Analytical model of gate leakage current through bilayer oxide stack in advanced MOSFET
Basak, Rathin, Maiti, Biswajit, Mallik, AbhijitVolume:
80
Language:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2014.12.018
Date:
April, 2015
File:
PDF, 881 KB
english, 2015