Analytical model of gate leakage current through bilayer...

Superlattices and Microstructures 2015 / 04 Vol. 80

Analytical model of gate leakage current through bilayer oxide stack in advanced MOSFET

Basak, Rathin, Maiti, Biswajit, Mallik, Abhijit
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Volume:
80
Language:
english
Journal:
Superlattices and Microstructures
DOI:
10.1016/j.spmi.2014.12.018
Date:
April, 2015
File:
PDF, 881 KB
english, 2015
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