Effect of pre-deposition RF plasma etching on wafer surface morphology and crystal orientation of piezoelectric AlN thin films
Felmetsger, V., Mikhov, M., Laptev, P.Volume:
62
Language:
english
Journal:
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
DOI:
10.1109/TUFFC.2014.006742
Date:
February, 2015
File:
PDF, 13.12 MB
english, 2015