High hole lifetime (3.8 [micro sign]s) in 4H-SiC diodes with 5.5 kV blocking voltage
Ivanov, P.A., Levinshtein, M.E., Irvine, K.G., Kordina, O., Palmour, J.W., Rumyantsev, S.L., Singh, R.Volume:
35
Year:
1999
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19990897
File:
PDF, 215 KB
english, 1999