[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Spallation neutron source beam loss monitor system
Gassner, D., Cameron, P., Mi, C., Witkover, R.Volume:
4
Year:
2003
Language:
english
DOI:
10.1109/pac.2003.1289149
File:
PDF, 213 KB
english, 2003