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A Novel Technique for Reducing Leakage Current by Application of Zero-Sequence Voltage
Ayano, Hideki, Murakami, Kouhei, Matsui, YoshihiroVolume:
51
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/tia.2015.2391440
Date:
July, 2015
File:
PDF, 2.03 MB
english, 2015