Microstructure of V-based ohmic contacts to AlGaN/GaN heterostructures at a reduced annealing temperature
Schmid, A., Schroeter, Ch., Otto, R., Schuster, M., Klemm, V., Rafaja, D., Heitmann, J.Volume:
106
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4907735
Date:
February, 2015
File:
PDF, 1.45 MB
english, 2015