Modeling of Copper Diffusion in Amorphous Aluminum Oxide in CBRAM Memory Stack
Sankaran, K., Goux, L., Clima, S., Mees, M., Kittl, J. A., Jurczak, M., Altimime, L., Rignanese, G.-M., Pourtois, G.Volume:
45
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/1.3700896
Date:
April, 2012
File:
PDF, 1.03 MB
english, 2012