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RF-SiP Reflectometer Technology for RF Testers
Kimishima, Masayuki, Nakayama, Yoshikazu, Kogami, YoshinoriVolume:
97
Language:
english
Journal:
Electronics and Communications in Japan
DOI:
10.1002/ecj.11621
Date:
December, 2014
File:
PDF, 2.69 MB
english, 2014