Yield and Reliability Improvement Techniques for Emerging...

IEEE Journal on Emerging and Selected Topics in Circuits and Systems 2015 / 3 Vol. 5; Iss. 1

Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM

Kang, Wang, Zhang, Liuyang, Zhao, Weisheng, Klein, Jacques-Olivier, Zhang, Youguang, Ravelosona, Dafine, Chappert, Claude
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
5
Language:
english
Journal:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
DOI:
10.1109/jetcas.2014.2374291
Date:
March, 2015
File:
PDF, 2.75 MB
english, 2015
Conversion to is in progress
Conversion to is failed