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Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM
Kang, Wang, Zhang, Liuyang, Zhao, Weisheng, Klein, Jacques-Olivier, Zhang, Youguang, Ravelosona, Dafine, Chappert, ClaudeVolume:
5
Language:
english
Journal:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
DOI:
10.1109/jetcas.2014.2374291
Date:
March, 2015
File:
PDF, 2.75 MB
english, 2015