Growth and characterization of CuxS (x=1.0, 1.76, and 2.0)...

Journal of Physics and Chemistry of Solids 2007 Vol. 68; Iss. 9

Growth and characterization of CuxS (x=1.0, 1.76, and 2.0) thin films grown by solution growth technique (SGT)

S.V. Bagul, S.D. Chavhan, Ramphal Sharma
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Volume:
68
Year:
2007
Language:
english
Pages:
7
DOI:
10.1016/j.jpcs.2007.03.053
File:
PDF, 633 KB
english, 2007
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