Transmission Electron Microscopy Investigation of Dislocations in GaN Layer Grown by Facet-Controlled Epitaxial Lateral Overgrowth
Honda, Yoshiaki, Iyechika, Yasushi, Maeda, Takayoshi, Miyake, Hideto, Hiramatsu, KazumasaVolume:
40
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/jjap.40.l309
Date:
April, 2001
File:
PDF, 1.58 MB
english, 2001