IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL...

International Journal of PIXE 2001 / 01 Vol. 11; Iss. 1n2

IMPROVEMENT IN THE PRECISION AND THE FACILITY OF CHEMICAL SHIFT MEASUREMENTS USING A POSITION-SENSITIVE CRYSTAL SPECTROMETER FOR PIXE

MAEDA, KUNIKO, TONOMURA, ATSURO, HAMANAKA, HIROMI, HASEGAWA, KENICHI
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Volume:
11
Language:
english
Journal:
International Journal of PIXE
DOI:
10.1142/S0129083501000062
Date:
January, 2001
File:
PDF, 457 KB
english, 2001
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