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Temperature Effect on AlN/SiO 2 Gate pH-Ion-Sensitive Field-Effect Transistor Devices
Chiang, Jung-Lung, Chen, Ying-Chung, Chou, Jung-Chuan, Cheng, Chien-ChuanVolume:
41
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.41.541
Date:
February, 2002
File:
PDF, 161 KB
english, 2002