Frequency-Modulated Charge Pumping With Extremely High Gate...

IEEE Transactions on Electron Devices 2015 / 3 Vol. 62; Iss. 3

Frequency-Modulated Charge Pumping With Extremely High Gate Leakage

Ryan, Jason Thomas, Zou, Jibin, Southwick, Richard, Campbell, Jason Paul, Cheung, Kin P., Oates, Anthony S., Huang, Ru
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2395956
Date:
March, 2015
File:
PDF, 1.79 MB
english, 2015
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