CHARACTERIZATION OF FLUX-GROWN TRACE-ELEMENT-DOPED TITANITE...

The Canadian Mineralogist 2009 / 08 Vol. 47; Iss. 4

CHARACTERIZATION OF FLUX-GROWN TRACE-ELEMENT-DOPED TITANITE USING THE HIGH-MASS-RESOLUTION ION MICROPROBE (SHRIMP-RG)

Mazdab, F. K.
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Volume:
47
Journal:
The Canadian Mineralogist
DOI:
10.3749/canmin.47.4.813
Date:
August, 2009
File:
PDF, 1.17 MB
2009
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