The reliability properties of MOCVD PZT thin films on...

Integrated Ferroelectrics 2001 / 01 Vol. 33; Iss. 1-4

The reliability properties of MOCVD PZT thin films on multilayer PT/IR electrodes

Li, Tingkai, Hsu, Sheng Teng
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Volume:
33
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108222291
Date:
January, 2001
File:
PDF, 444 KB
english, 2001
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