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[IEEE 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - Beijing, China (Oct. 18-21, 2004)] Proceedings. 7th International Conference on Solid-State and Integrated Circuits Technology, 2004. - A study of parametric yield estimation by uniform design sampling
Ming-e Jing,, Jun-ping Wang,, Ke-dong Chen,, Yue Hao,Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/icsict.2004.1436691
File:
PDF, 1.07 MB
english, 2004