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Window-based peak power model and Particle Swarm Optimization guided 3-dimensional bin packing for SoC test scheduling
Karmakar, Rajit, Chattopadhyay, SantanuVolume:
50
Language:
english
Journal:
Integration, the VLSI Journal
DOI:
10.1016/j.vlsi.2015.01.006
Date:
June, 2015
File:
PDF, 1.50 MB
english, 2015