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STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
Sawada, H., Tanishiro, Y., Ohashi, N., Tomita, T., Hosokawa, F., Kaneyama, T., Kondo, Y., Takayanagi, K.Volume:
58
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfp030
Date:
December, 2009
File:
PDF, 688 KB
english, 2009