STRUCTURE-ENHANCED YIELD SHEAR STRESS IN ELECTRORHEOLOGICAL...

International Journal of Modern Physics B 2002 / 07 Vol. 16; Iss. 17n18

STRUCTURE-ENHANCED YIELD SHEAR STRESS IN ELECTRORHEOLOGICAL FLUIDS

Tao, R., Lan, Y. C., Xu, X.
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Volume:
16
Language:
english
Journal:
International Journal of Modern Physics B
DOI:
10.1142/S021797920201275X
Date:
July, 2002
File:
PDF, 1.19 MB
english, 2002
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