[IEEE IEEE Ultrasonics Symposium, 2005. - Rotterdam, The Netherlands (18-21 Sept. 2005)] IEEE Ultrasonics Symposium, 2005. - Analysis of saw devices using FEM/BEM method and parallel computing
Perois, X., Pastureaud, T., Girard, P.-A., Lardat, R.Volume:
3
Year:
2005
Language:
english
DOI:
10.1109/ultsym.2005.1603158
File:
PDF, 272 KB
english, 2005