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[IEEE 2014 Conference on Design of Circuits and Integrated Systems (DCIS) - Madrid, Spain (2014.11.26-2014.11.28)] Design of Circuits and Integrated Systems - System-level modeling of microprocessor reliability degradation due to TDDB
Chen, Chang-Chih, Cha, Soonyoung, Milor, LindaYear:
2014
Language:
english
DOI:
10.1109/dcis.2014.7035568
File:
PDF, 800 KB
english, 2014