Analysis of electric field distributions in ultra-shallow...

Analysis of electric field distributions in ultra-shallow silicon junctions under thermodynamic equilibrium conditions

SILARD, ANDREI P.
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Volume:
63
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/00207218708547345
Date:
October, 1987
File:
PDF, 824 KB
english, 1987
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