Depth distributions of silver ions implanted in Si and SiO...

Depth distributions of silver ions implanted in Si and SiO 2

Barcz, A., Turos, A., Wieluński, L., Rosiński, W., Wojtowicz-natanson, B.
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Volume:
25
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337577508234733
Date:
January, 1975
File:
PDF, 383 KB
english, 1975
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