Depth distributions of silver ions implanted in Si and SiO 2
Barcz, A., Turos, A., Wieluński, L., Rosiński, W., Wojtowicz-natanson, B.Volume:
25
Language:
english
Journal:
Radiation Effects
DOI:
10.1080/00337577508234733
Date:
January, 1975
File:
PDF, 383 KB
english, 1975