An integrated Silicon Drift Detector System for FEI...

Microscopy and Microanalysis 2009 / 7 Vol. 15; Iss. S2

An integrated Silicon Drift Detector System for FEI Schottky Field Emission Transmission Electron Microscopes

Harrach, HS von, Dona, P, Freitag, B, Soltau, H, Niculae, A, Rohde, M
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Volume:
15
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927609094288
Date:
July, 2009
File:
PDF, 325 KB
english, 2009
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