Simulation of SOFC stack and repeat elements including interconnect degradation and anode reoxidation risk
D. Larrain, J. Van herle, D. FavratVolume:
161
Year:
2006
Language:
english
Pages:
12
DOI:
10.1016/j.jpowsour.2006.04.151
File:
PDF, 957 KB
english, 2006