Experimental Investigation of Program Voltage (20 V)...

IEEE Transactions on Components Packaging and Manufacturing Technology 2015 / 2 Vol. 5; Iss. 2

Experimental Investigation of Program Voltage (20 V) Generation With Boost Converter for 3-D-Stacked NAND Flash SSD

Hatanaka, Teruyoshi, Johguchi, Koh, Takeuchi, Ken
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Volume:
5
Language:
english
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology
DOI:
10.1109/TCPMT.2014.2381267
Date:
February, 2015
File:
PDF, 1.68 MB
english, 2015
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