In situ X-ray diffraction studies on the mechanism of...

Journal of Power Sources 2007 Vol. 174; Iss. 2

In situ X-ray diffraction studies on the mechanism of capacity retention improvement by coating at the surface of LiCoO2

Kyung Yoon Chung, Won-Sub Yoon, James McBreen, Xiao-Qing Yang, Si Hyoung Oh, Ho Chul Shin, Won Il Cho, Byung Won Cho
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Volume:
174
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.jpowsour.2007.06.242
File:
PDF, 819 KB
english, 2007
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