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Effect of Threading Dislocations on the Quality Factor of InGaN/GaN Microdisk Cavities
Puchtler, Tim J., Woolf, Alexander, Zhu, Tongtong, Gachet, David, Hu, Evelyn L., Oliver, Rachel A.Volume:
2
Language:
english
Journal:
ACS Photonics
DOI:
10.1021/ph500426g
Date:
January, 2015
File:
PDF, 2.42 MB
english, 2015