Membrane degradation mechanism during open-circuit voltage hold test
Atsushi Ohma, Shinji Yamamoto, Kazuhiko ShinoharaVolume:
182
Year:
2008
Language:
english
Pages:
9
DOI:
10.1016/j.jpowsour.2008.03.078
File:
PDF, 1.73 MB
english, 2008