Membrane degradation mechanism during open-circuit voltage...

Membrane degradation mechanism during open-circuit voltage hold test

Atsushi Ohma, Shinji Yamamoto, Kazuhiko Shinohara
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Volume:
182
Year:
2008
Language:
english
Pages:
9
DOI:
10.1016/j.jpowsour.2008.03.078
File:
PDF, 1.73 MB
english, 2008
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