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Post-etching mesa surface composition investigation of InAs/GaSb type-II strained layer superlattices using XPS characterization
Klein, B., Artyushkova, K., Plis, E., Jamus, A., Maji, S., Casias, L., Kutty, M.N., Krishna, S.Volume:
70
Language:
english
Journal:
Infrared Physics & Technology
DOI:
10.1016/j.infrared.2014.10.010
Date:
May, 2015
File:
PDF, 1.05 MB
english, 2015