Single-Event Performance and Layout Optimization of...

IEEE Transactions on Nuclear Science 2013 / 08 Vol. 60; Iss. 4

Single-Event Performance and Layout Optimization of Flip-Flops in a 28-nm Bulk Technology

Lilja, K., Bounasser, M., Wen, S.-J., Wong, R., Holst, J., Gaspard, N., Jagannathan, S., Loveless, D., Bhuva, B.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2013.2273437
Date:
August, 2013
File:
PDF, 834 KB
english, 2013
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