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High-Throughput and Label-Free Single Nanoparticle Sizing Based on Time-Resolved On-Chip Microscopy
McLeod, Euan, Dincer, T. Umut, Veli, Muhammed, Ertas, Yavuz N., Nguyen, Chau, Luo, Wei, Greenbaum, Alon, Feizi, Alborz, Ozcan, AydoganVolume:
9
Language:
english
Journal:
ACS Nano
DOI:
10.1021/acsnano.5b00388
Date:
March, 2015
File:
PDF, 1.24 MB
english, 2015