On the permanent component profiling of the negative bias...

Solid-State Electronics 2015 / 04 Vol. 106

On the permanent component profiling of the negative bias temperature instability in p-MOSFET devices

Djezzar, Boualem, Tahi, Hakim, Benabdelmoumene, Abdelmadjid, Chenouf, Amel, Goudjil, Mohamed, Kribes, Youcef
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Volume:
106
Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2015.01.001
Date:
April, 2015
File:
PDF, 2.70 MB
english, 2015
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