Straightforward electrical measurement of forward-voltage...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2014 / 11 Vol. 32; Iss. 6

Straightforward electrical measurement of forward-voltage to investigate thermal effects in InGaN/GaN high-brightness light-emitting diodes

Hancock, Bobby Logan, Holtz, Mark
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Volume:
32
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4901411
Date:
November, 2014
File:
PDF, 1.12 MB
english, 2014
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