Beam characterization of a monolithic ΔE/E silicon device

Beam characterization of a monolithic ΔE/E silicon device

Agosteo, S., Barcellan, L., Borsato, E., D׳Angelo, G., Dal Corso, F., Fazzi, A., Gonella, F., Introini, M.V., Lippi, I., Lorenzoli, M., Pegoraro, M., Pola, A., Varoli, V., Zotto, P.
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Volume:
779
Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2014.12.102
Date:
April, 2015
File:
PDF, 1.68 MB
english, 2015
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