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[IEEE 2014 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Lanzhou, China (2014.7.13-2014.7.16)] 2014 International Conference on Wavelet Analysis and Pattern Recognition - Panoramic face and ear image stitching in multi-modal recognition
Li, Fang-Shi, Mu, Zhi-Chun, Chen, LongYear:
2014
Language:
english
DOI:
10.1109/icwapr.2014.6961295
File:
PDF, 5.83 MB
english, 2014