A current monitoring technique for IDDQ testing in digital...

Integration, the VLSI Journal 2015 / 06 Vol. 50

A current monitoring technique for IDDQ testing in digital integrated circuits

Matakias, Sotiris, Tsiatouhas, Yiorgos, Arapoyanni, Angela, Haniotakis, Themistoklis
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Volume:
50
Language:
english
Journal:
Integration, the VLSI Journal
DOI:
10.1016/j.vlsi.2015.01.005
Date:
June, 2015
File:
PDF, 3.89 MB
english, 2015
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