Effects of nanoscale surface roughness on the resistivity of ultrathin epitaxial copper films
Timalsina, Yukta P, Horning, Andrew, Spivey, Robert F, Lewis, Kim M, Kuan, Tung-Sheng, Wang, Gwo-Ching, Lu, Toh-MingVolume:
26
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/26/7/075704
Date:
February, 2015
File:
PDF, 3.28 MB
english, 2015