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Quantitative imaging of electrospun fibers by PeakForce Quantitative NanoMechanics atomic force microscopy using etched scanning probes
Chlanda, Adrian, Rebis, Janusz, Kijeńska, Ewa, Wozniak, Michal J., Rozniatowski, Krzysztof, Swieszkowski, Wojciech, Kurzydlowski, Krzysztof J.Volume:
72
Language:
english
Journal:
Micron
DOI:
10.1016/j.micron.2015.01.005
Date:
May, 2015
File:
PDF, 2.76 MB
english, 2015