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Effect of alumina thickness on Al 2 O 3 /InP interface with post deposition annealing in oxygen ambient
Yang, Zhuo, Yang, Jing-Zhi, Huang, Yong, Zhang, Kai, Hao, YueVolume:
23
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/23/7/077305
Date:
July, 2014
File:
PDF, 300 KB
english, 2014