Characterization and modeling of power MOSFET switching...

Microelectronics Reliability 2015 / 02 Vol. 55; Iss. 3-4

Characterization and modeling of power MOSFET switching times variations under constant electrical stress

Sezgin, Hatice Gül, Özçelep, Yasin
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Volume:
55
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2015.01.002
Date:
February, 2015
File:
PDF, 1.54 MB
english, 2015
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