An improved AFM cross-sectional method for piezoelectric...

Nanotechnology 2011 / 03 Vol. 22; Iss. 10

An improved AFM cross-sectional method for piezoelectric nanostructures properties investigation: application to GaN nanowires

Xu, Xin, Potié, Alexis, Songmuang, Rudeesun, Lee, Jae Woo, Bercu, Bogdan, Baron, Thierry, Salem, Bassem, Montès, Laurent
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Volume:
22
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/22/10/105704
Date:
March, 2011
File:
PDF, 1.16 MB
english, 2011
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