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Positive gate-bias temperature instability of ZnO thin-film transistor
Liu, Yu-Rong, Su, Jing, Lai, Pei-Tao, Yao, Ruo-HeVolume:
23
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/23/6/068501
Date:
June, 2014
File:
PDF, 445 KB
english, 2014