Photoreflectance Characterization of Ordered/Disordered...

Japanese Journal of Applied Physics 2003 / 7 Vol. 42; Iss. Part 1, No

Photoreflectance Characterization of Ordered/Disordered GaAs 0.5 Sb 0.5 layers Grown on InP Substrates by Molecular Beam Epitaxy

Kawamura, Yuichi, Amano, Masanobu, Ouchi, Koichi, Inoue, Naohisa
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Volume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.42.4288
Date:
July, 2003
File:
PDF, 124 KB
english, 2003
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