Effects of annealing process on characteristics of fully transparent zinc tin oxide thin-film transistor
Chen, Yong-Yue, Wang, Xiong, Cai, Xi-Kun, Yuan, Zi-Jian, Zhu, Xia-Ming, Qiu, Dong-Jiang, Wu, Hui-ZhenVolume:
23
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/23/2/026101
Date:
February, 2014
File:
PDF, 1.13 MB
english, 2014