![](/img/cover-not-exists.png)
Structural Properties of GaN Films with AlN Buffer Layers with Varying Growth Temperatures by Plasma-Assisted Molecular Beam Epitaxy
Shim, Byoung-Rho, Okita, Hideyuki, Jeganathan, Kulandaivel, Shimizu, Mitsuaki, Okumura, HajimeVolume:
42
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.42.2265
Date:
April, 2003
File:
PDF, 181 KB
english, 2003