A transmission line-type electrical model for tapered TSV considering MOS effect and frequency-dependent behavior
Liu, Song, Shan, Guangbao, Xie, Chengmin, Du, XinrongVolume:
36
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/36/2/024009
Date:
February, 2015
File:
PDF, 1.29 MB
english, 2015